The transient time-resolved reflectivity of chromium film is studied by femtosecond pump-probe technique with a 70-fs laser. Experimental results show that the reflectivity change increases with the power of the pump laser. The fast decrease of the reflectivity occurs between 0-200 fs which is mainly due to the electron-electron interaction. Subsequencely, the slower recovery of the reflectivity between 200-900 fs is mainly due to the electron-phonon coupling process. The reflectivity after 900 fs rises little to a near-constant value for the thermal equilibrium of the system. The experimental results can be explained properly with numerical simulation of the two-temperature model. It is helpful for understanding of the electron ultrafast dynamics in chromium film.
A deep binary silicon grating as high-extinction-ratio reflective polarizing beam splitter （PBS） at the wavelength of 1550 nm is presented. The design is based on the phenomenon of total internal reflection （TIR） by using the rigorous coupled wave analysis （RCWA）. The extinction ratio of the rectangular PBS grating can reach 2.5~105 with the optimum grating period of 397 nm and groove depth of 1.092 μm. The efficiencies of TM-polarized wave in the 0th order and TE-polarized wave in the -1st order can both reach unity at the Littrow angle. Holographic recording technology and inductively coupled plasma （ICP） etching could be used to fabricate the silicon PBS grating.
We find the femtosecond laser induced microripple beside the focused femtosecond laser spot and along the movement direction of the laser spot on polydimethylsiloxane （PDMS） surface. The microripple may be due to the melting of PDMS induced by femtosecond laser pulses and the subsequent cool-down solidification of the melting PDMS along with the movement of the femtosecond laser spot. This result will be helpful to understand the interaction between the femtosecond laser and the polymer.
